Electron Microscopy and Analysis Group: Advances in EM Instrumentation and Techniques
Session organisers: Dr Ian MacLaren, Prof Mike Walls and Dr Richard Beanland
Wednesday 2nd July from 10.00-12.00 and 13.30-15.00
The last few years have seen major advances in electron microscopy as a result of the practical correction of geometric aberrations in either image or probe formation. Since that time there have been further major developments in correction of chromatic aberration, monochromation, higher speed and higher quantum efficiency imaging detectors, much improved X-ray spectrometers, major developments in electron energy loss spectrometry, and incorporation of novel and non-standard detectors into STEM instruments including secondary electron detectors and cathodoluminescence spectrometers.
Such developments have also enabled a range of novel data analysis techniques to be developed to make the most of the new possibilities available to provide a fuller atomic scale or nanoscale description of nanostructures in materials than ever before. This session will highlight the very latest progress in both instrumentation and techniques across the whole range of electron microscopy including invited talks from leaders in this field and submissions for oral presentations and posters on new developments in instrumentation, techniques and their application to problems in nanoscale science are invited.